Search Results - jan wei pan

1 Results Sort By:
An Integrated Method and System for Full-field Strain Measurement and Material Constitutive Characterization on Uniaxial Testing Machine
This technology offers an integrated analytical, numerical, and computational methodology and hardware system which enables high-fidelity, full-field displacement and strain measurement along with constitutive material characterization of material specimens. Using an innovative, digital imaging based, meshless, random grid method; the present inve...
Published: 9/14/2012   |   Inventor(s): Tomonari Furukawa, Jinquan Cheng, Jan Wei Pan, John Michopoulos, Athanasios Iliopoulos
Keywords(s):  
Category(s): Computer Software, Diagnostic, Imaging, Computer Hardware, Engineering
© 2019. All Rights Reserved. Powered by Inteum