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Evanescent Wave Atomic Force Microscopy
This invention is a method to measure the separation between the surface of a solid and the probe in a Scanning Probe Microscope (SPM), e.g., an Atomic Force Microscope (AFM). The detection is non-destructive and easy to implement. For example. in a conventional AFM measurement, the separation between the probe and the sample must be inferred from...
Published: 9/3/2012   |   Inventor(s): William Ducker, Spencer Clark, John Walz
Keywords(s):  
Category(s): Devices