Evanescent Wave Atomic Force Microscopy
This invention is a method to measure the separation between the surface of a solid and the probe in a Scanning Probe Microscope (SPM), e.g., an Atomic Force Microscope (AFM). The detection is non-destructive and easy to implement. For example. in a conventional AFM measurement, the separation between the probe and the sample must be inferred from an examination of the forces. The invention allows the separation to be measured independently and without corruption by thermal drift. Possible applications include automation of tip approach to the surface, even at distances where there is no surface force; scanning at a constant height above the sample, force-separation measurement, with true measurement of separation; and imaging in highly absorbing liquids.
Method and Apparatus for Evanescent Field Measuring of Particle-Solid Separation
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