An Integrated Method and System for Full-field Strain Measurement and Material Constitutive Characterization on Uniaxial Testing Machine

Description:

This technology offers an integrated analytical, numerical, and computational methodology and hardware system which enables high-fidelity, full-field displacement and strain measurement along with constitutive material characterization of material specimens.

Using an innovative, digital imaging based, meshless, random grid method; the present invention offers improved accuracy and reliability over existing methods for boundary displacement and strain measurement. Additionally, this technology advantageously enables accurate material characterization.

Further, the development of a hardware system, consisting of a multiple digital camera fixture, is designed to mount on existing uniaxial testing machine for accurate measurement of boundary forces, displacement, and full-field strain measurement.

Patent Information:
For Information, Contact:
Grant Brewer
Senior Licensing Associate
Virginia Tech Intellectual Properties, Inc.
(540) 443-9218
gbrewer@vtip.org
Inventors:
Tomonari Furukawa
Jinquan Cheng
Jan Wei Pan
John Michopoulos
Athanasios Iliopoulos
Keywords:
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